test facilities

>> ULTRA-FINE PARTICLES

Fine and ultrafine particles measurement

SMPS: Scanning Mobility Particle Sizer.

(c) CERTAM Although this equipment may not be used to study in a simple way transitive phenomena, it offers a very good precision in the sub-micron domain : it can measure particle size distribution of an aerosol between 7 nm and 900 nm.

Particles diameters given by this analysis are electrical mobility diameter which may easily be compared to aerodynamics diameters.

Results are usually given as size distribution number (bar-plots or size distribution function) with 64 size classes per decade.

SMPS: Electrical mobility analysis principle

(c) CERTAM T he principle of the electrostatic classifier is based on the monotonic relationship between electrical mobility and particle size with singly charged particles.

To ensure a fixed percentage of particles carrying one unit of charge, the particles are introduced to a bipolar charge where they undergo frequent collisions with bipolar ions. This process is known as bipolar charging or "neutralization". As a result, an equilibrium state is obtained, with known percentages of particles carrying no charge, a single charge, or multiple charges. These aerosol particles are then measured with the differential mobility analyzer. The mobility distribution, and hence size distribution, can be determined from the measurement.

Particle counting

(c) CERTAM Submicrometer particles are drawn into the Condensation Particle Counter and enlarged by condensation of a supersaturated vapor into droplets that measure several micrometers in diameter. The droplets pass through a lighted viewing volume where they scatter light. The scattered-light pulses are collected by a photodetector and converted into electrical pulses. The electrical pulses are then counted and their rate (calculated) is a measure of particle concentration.


Contact: frantz.gouriou@certam-rouen.com

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